ficonTEC proudly announces the release of a new single-sided electro-optical wafer-level tester, a first-of-its-kind solution fully compatible with the world’s two largest semiconductor ATE (automated ...
An industry first, ficonTEC’s new 300 mm double-sided electro-optical wafer tester is compatible with existing semiconductor ATE architectures and is targeted at AI-driven silicon photonics computing ...
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