Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.

Successful high-speed projects begin with a series of test cards.The cards test whatever new package layout, PCB (printed-circuit-board)-layer stack, and connector features the productwill use. They ...

Over the past 10 years, the DRAM market has been one of the toughest commodity businesses in the electronics industry. Bit growth has averaged more than 60% per year, but at the same time, cycles of ...

Yamaichi Electronics offer new products for the wafer-level test of VLSI semiconductors. The new development YVERTICAL® is a vertical probe card with miniaturised spring probe contacts designed for ...

I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...