ficonTEC’s new WaferLine Test (WLT) product line is specially designed as a versatile, fully automatable test-&-measurement system platform for wafer-level device test. They systems provide fully ...
ficonTEC proudly announces the release of a new single-sided electro-optical wafer-level tester, a first-of-its-kind solution fully compatible with the world’s two largest semiconductor ATE (automated ...