A joint research team has successfully identified, for the first time, the specific types of defects responsible for efficiency loss in silicon heterojunction (SHJ) solar cells. Subscribe to our ...

The most commonly seen defects at birth are congenital heart defects (CHD). These anomalies arise when there is a failure of the heart or its major blood vessels to form properly during embryonic ...

A technical paper titled “Accelerating Defect Predictions in Semiconductors Using Graph Neural Networks” was published by researchers at Purdue University, Indian Institute of Technology (IIT) Madras, ...

Scientists used Lorentz transmission electron microscopy (LTEM) to visualize topological defects. They were able to do so by passing electrons and observing their deflections through a thin magnetic ...

Korean researchers revealed that efficiency losses in heterojunction solar cells arise from two coexisting defect types – dangling bonds and weak silicon-silicon bonds. Their findings explain how ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

SEMVision™ H20 enables better and faster analysis of nanoscale defects in leading-edge chips Second-generation “cold field emission” technology provides high-resolution imaging AI image recognition ...

An atrial septal defect is a congenital heart issue. According to the Centers for Disease Control and Prevention (CDC), it develops in about 1 in 1,859 babies in the United States. An atrial septal ...

The IDDQ test relies on measuring the supply current (I DD) of an IC’s quiescent state, when the circuit isn’t switching and inputs are held at static values. Test patterns are used to place the ...